Anti-counterfeiting opto-thermal watermark for electronics

ABSTRACT

Some embodiments of the inventive subject matter include a computer program product for validating a test thermoreflective mark. The computer program product can include computer usable program code configured to control a temperature regulation unit configured to govern a temperature of a thermoreflective mark. The computer usable program code can be further configured to control an electromagnetic waver emitter to present at a first temperature, a first electromagnetic wave. The computer usable program code can be further configured to record a first reflective profile. The computer usable program code can be further configured to control the electromagnetic wave emitter to present at a second temperature, a second electromagnetic wave. The computer usable program code can be further configured to record a second reflective profile. The computer usable code can be further configured to validate the thermoreflective mark based on the first reflective profile and the second reflective profile.

BACKGROUND

Embodiments of the inventive subject matter generally relate to thefield of thermoreflectivity and more particularly, to thermoreflectivityand anti-counterfeiting measures.

A common problem among many consumer goods is counterfeiting,specifically in the computer industry and luxury goods market. Currentlyseveral anti-counterfeiting techniques exist, such as holograms,watermarks, color-changing inks, etc. Unfortunately, many of theseanti-counterfeiting techniques are vulnerable to replication. Becausemany anti-counterfeiting techniques are vulnerable to replication, itcan be difficult to distinguish authentic products from theircounterfeit counterparts.

SUMMARY

An anti-counterfeiting technique presents, to a test thermoreflectivemark at a first temperature, a first electromagnetic wave. A first testreflective profile for the test thermoreflective mark associated withthe first temperature is recorded. A second electromagnetic wave ispresented to the test thermoreflective mark at a second temperature. Asecond test reflective profile for the test thermoreflective markassociated with the second temperature is recorded. The first testreflective profile is compared with a first control reflective profilethat is associated with a genuine thermoreflective mark. The second testreflective profile is compared with a second control reflective profilethat is associated with the genuine thermoreflective mark.

BRIEF DESCRIPTION OF THE DRAWINGS

The present embodiments may be better understood, and numerous objects,features, and advantages made apparent to those skilled in the art byreferencing the accompanying drawings.

FIG. 1A is an overhead view of an example thermoreflective mark 100.

FIG. 1B is a cross-sectional view of an example thermoreflective mark108.

FIG. 2 depicts an example system for generating and recording reflectiveprofiles for a thermoreflective mark 212.

FIG. 3 is a flow diagram illustrating example operations for generatingand recording reflective profiles for a thermoreflective mark.

FIG. 4 is a flow diagram illustrating example operations for generatingand recording reflective profiles for a test thermoreflective mark andcomparing the reflective profiles for the test thermoreflective mark tocontrol reflective profiles.

FIG. 5 depicts an example computer system that includes athermoreflective anti-counterfeiting unit 514.

DESCRIPTION OF EMBODIMENT(S)

The description that follows includes exemplary systems, methods,techniques, instruction sequences and computer program products thatembody techniques of the present inventive subject matter. However, itis understood that the described embodiments may be practiced withoutthese specific details. For instance, although examples refer tomeasuring reflective profiles of a thermoreflective mark at twotemperatures, in some embodiments, greater or fewer than twotemperatures can be used to create reflective profiles. In otherinstances, well-known instruction instances, protocols, structures andtechniques have not been shown in detail in order not to obfuscate thedescription.

A thermoreflective mark has both a particular pattern and a temperaturesensitive coating. Because of the temperature sensitive coating, thereflectivity of the thermoreflective mark changes with variations intemperature. A “fingerprint” can be created for the thermoreflectivemark, using, for example, a light emitter and a light detector. Thereflectivity of the thermoreflective mark can be measured at differenttemperatures. This fingerprint can then be stored in a database, andused for comparison purposes in identifying counterfeit goods. Examplerepresentations of the fingerprint that may be stored for use invalidating goods include reflectance profiles and a reflectancecoefficient.

FIG. 1A is an overhead view of an example thermoreflective mark 100. Thethermoreflective mark 100 comprises a coating that is temperaturesensitive (a “thermoreflective coating”). The reflectivity of thethermoreflective mark 100 varies proportionally with temperature. Forexample, the thermoreflective mark 100 can reflect more or less light(or other electromagnetic wave to which it is subjected) dependent onthe temperature of the thermoreflective mark 100. The thermoreflectivemark 100 also comprises a specified pattern. The example specifiedpattern depicted in FIG. 1A includes four quadrants 102. Each quadrant102 includes markings, such as etchings 104 and deposits 106. In someembodiments, the etchings 104 can be etched directly into the materialon which the thermoreflective mark 100 is placed, and the deposits 106can be metallic deposits positioned on the material on which thethermoreflective mark 100 is placed. The thermoreflective mark 100 issubjected to electromagnetic waves (e.g., light), and a reflectivityprofile for the thermoreflective mark 100 is recorded.

The thermoreflective mark 100 provides two layers of anti-counterfeitingprotection. First, the specified pattern causes an associatedelectromagnetic wave dispersion and reflection pattern. Second, thethermoreflective properties of the thermoreflective mark 100 cause thereflection pattern to vary proportionally to changes in temperature. Tosuccessfully counterfeit the thermoreflective mark 100, both the patternand the proper thermoreflective properties of the thermoreflective mark100 must be produced. The pattern can be varied for each item produced,by lot of items, weekly, monthly, etc., to provide an even greater levelof anti-counterfeiting protection. Additionally, in some embodiments,the thermoreflective properties of the thermoreflective mark 100 can bevaried (e.g., by changing the composition of the thermoreflectivecoating, thickness of the thermoreflective coating, etc.) for each itemproduced, by lot of items, weekly, monthly, etc.

FIG. 1B is a cross-sectional view of an example thermoreflective mark108. As described in the discussion of FIG. 1A, the thermoreflectivemark 108 comprises a thermoreflective coating 110 and a unique patterncomprising deposits 112 and etchings 114. In some embodiments, thethermoreflective mark 108 is an object separate from the item to whichthe thermoreflective mark 108 is affixed. For example, thethermoreflective mark 108 can be produced separately (e.g., a sticker)and affixed to an item, such as a computer motherboard. In otherembodiments, the thermoreflective mark 108 can be part of the item. Forexample, a unique pattern can be created by etching the bare siliconside of a computer chip and placing metallic deposits on the baresilicon side of the computer chip. A thermoreflective coating 110 (e.g.,a thin film) can be used to coat the area of the computer chip (or theentirety of the motherboard) to provide the thermoreflective mark 108with its thermoreflective properties. In embodiments in which thethermoreflective mark 108 is part of the item itself, standard siliconprocessing tools can be used to create the thermoreflective mark 108.For example, during fabrication of the computer chip, standardmicroelectronics fabrication tools (e.g., a photolithography tool, athin film deposition tool, an etching tool, etc.) can be programmed toread computerized files containing a specified pattern and create thespecified pattern on the item. One or more of the microelectronicsfabrication tools can etch the bare silicon side of the computer chipand place metallic deposits on the bare silicon side of the computerchip according to the specified pattern. Additionally, a lid, or someother packaging, can include the thermoreflective mark. Whether thethermoreflective mark is part of the item itself or the thermoreflectivemark is part of a lid or some other packaging, creation of the specifiedpattern can be additive (e.g., depositing a thin film on top of theitem/lid and specified pattern), subtractive (e.g., etching featuresdirectly into the item/lid), or both.

FIG. 2 depicts an example system for generating and recording reflectiveprofiles for a thermoreflective mark 212. Reflective profiles can berecorded for the thermoreflective mark 212 to create an identifyingfingerprint for the thermoreflective mark 212. As depicted in FIG. 2,the example system comprises an electromagnetic wave source 206 and anelectromagnetic wave detector 210. In some embodiments, theelectromagnetic wave source 206 can be a light emitter, emitting lightcomprising a number of wavelengths (e.g., white light) or a lightemitter emitting light at a single or small grouping of wavelengths(e.g., a laser). The electromagnetic wave 208 is emitted by theelectromagnetic wave source 206 to the thermoreflective mark 212 andreflected to, and detected by, the electromagnetic wave detector 210.The reflected electromagnetic wave 208 is used to create a reflectiveprofile for the thermoreflective mark 212. In some embodiments,additional data points can be created and added to the reflectiveprofile by altering the position of the electromagnetic wave source 206(as shown by arrow 202) and the electromagnetic wave detector 210 (asshown by arrow 204). Recording the reflectivity of the mark at variedincidence angles can create a richer reflective profile.

FIG. 3 is a flow diagram illustrating example operations for generatingand recording reflective profiles for a thermoreflective mark.Reflective profiles can be recorded at varying temperatures to create anidentifying fingerprint for the thermoreflective mark. These operationscan be performed on each item containing a thermoreflective mark tocreate a database used in identifying authentic thermoreflective marks,and by extension, authentic goods. In other words, the operationsdepicted in FIG. 3 can be used to create a database of controlreflective profiles (and identifying fingerprints) for thermoreflectivemarks. The flow begins at block 302.

At block 302, an electromagnetic wave source presents a firstelectromagnetic wave to a thermoreflective mark at a first temperature.The electromagnetic wave source can emit an electromagnetic wave of anytype that is suitable to producing a reflective profile, and can changeposition relative to the thermoreflective mark. Additionally,wavelength(s) of the emitted electromagnetic wave, incidence angle(s) ofthe electromagnetic wave, the first temperature, etc. can be controlledas to allow for easy verification of the authenticity ofthermoreflective marks that are not known to be genuine. The flowcontinues at block 304.

At block 304, an electromagnetic wave detector records a first controlreflective profile. The first control reflective profile includes allreflectivity readings at the first temperature, which can range from asingle wavelength at a single incidence angle to multiple wavelengths atmultiple incidence angles, and the various permutations thereof.Although the operations at blocks 302 and 304 are presented as occurringdiscretely in time, due to the high rate of speed at whichelectromagnetic waves travel, in practice, the operations at blocks 302and 304 will likely overlap in time (i.e., in practice, a large enoughnumber of photons (or other particles that comprise the electromagneticwave) will be emitted, and the speed of light (or other electromagneticwave) is such that the wave source will still be emitting photons as thefirst photons the wave source emitted reach the wave detector. The flowcontinues at block 306.

At block 306, the electromagnetic wave source presents a secondelectromagnetic wave to the thermoreflective mark at a secondtemperature. The wavelength(s) of the electromagnetic wave can be thesame as the wavelength(s) of the electromagnetic wave emitted at thefirst temperature, or can be different than the wavelength(s) of theelectromagnetic wave emitted at the first temperature. As with theoperation at block 302, the electromagnetic wave source can moverelative to the thermoreflective mark so as to create a rich reflectiveprofile for the thermoreflective mark. Additionally, the wavelength(s)of the emitted electromagnetic wave, an incidence angle of theelectromagnetic wave, the second temperature, etc. can be controlled soas to create easily reproducible results. The flow continues at block308.

At block 308, an electromagnetic wave detector records a second controlreflective profile. The second control reflective profile includes allreflectivity readings at the second temperature.

FIG. 4 is a flow diagram illustrating example operations for generatingand recording reflective profiles for a test thermoreflective mark (thetest thermoreflective mark being a the authenticity of which is unknown)and comparing the reflective profiles of the test thermoreflective markto control reflective profiles. In order to confirm the authenticity ofa thermoreflective mark, and by extension the good associated with thethermoreflective mark, a comparison between a reflective profile (i.e.,an identifying fingerprint) of the thermoreflective mark in question thetest thermoreflective mark and a thermoreflective profile (i.e., anidentifying fingerprint) of a known genuine thermoreflective mark can bemade. In some embodiments, each item contains a unique thermoreflectivemark. In such embodiments, a reflective profile is created for each itemand stored in a database (e.g., by serial number). To test theauthenticity of an item bearing a legitimate serial number, a reflectiveprofile can be created for the item and compared to the reflectiveprofile on file for the corresponding serial number. As another example,when thermoreflective marks are varied by lot number, a reflectiveprofile can be created for each lot and stored in a database by lotnumber. To test the authenticity of an item bearing a lot number, areflective profile can be created for the item and compared to thereflective profile on file for the corresponding lot number. The flowbegins at block 402.

At block 402, an electromagnetic wave source presents a firstelectromagnetic wave to a test mark at a first temperature. In someembodiments, the electromagnetic wave source emits an electromagneticwave having the same wavelength(s) as the electromagnetic wave used fora first control reflective profile. Additionally, in some embodiments,the first temperature is the same temperature as the temperature used increating the first control reflective profile. The flow continues atblock 404.

At block 404, an electromagnetic wave detector records the first testreflective profile. The first test reflective profile includes allreflectivity readings at the first temperature. The flow continues atblock 406.

At block 406, the electromagnetic wave source presents a secondelectromagnetic wave to the test mark at a second temperature. In someembodiments, the electromagnetic wave source emits an electromagneticwave having the same wavelength(s) as the electromagnetic wave used fora second control reflective profile. Additionally, in some embodiments,the second temperature is the same temperature as used in creating thesecond control reflective profile. The flow continues at block 408.

At block 408, an electromagnetic wave detector records the second testreflective profile. The second test reflective profile includes allreflectivity readings at the second temperature. The flow continues atdecision diamond 410.

At decision diamond 410, the first control reflective profile iscompared with the first test reflective profile. The first controlreflective profile is created using an authentic thermoreflective markfrom an item with a correct serial number, lot number, build date, etc.In some embodiments, the first (and second) control reflective profilesare created at the time of manufacture of the item. In such embodiments,the first (and second) control reflective profiles can be stored in adatabase. In other embodiments, a known authentic thermoreflective markcan be used to create the first (and second) control reflective profile.The reflective profiles can be compared using any suitable means for theimplementation of the reflective profile. Examples of reflectiveprofiles include an image of a graph that plots reflectance versusincidence angle, numerical values for a thermoreflectance coefficient, achart of data values (including, for example, reflectance, incidenceangle, position on the thermoreflective mark from which theelectromagnetic wave was reflected, temperature, and wavelength of theelectromagnetic wave), images captured of the electromagnetic wavereflected off of the thermoreflective mark, etc. For example, inembodiments in which the reflective profiles are images (or anyreflective profile type suitable to visual comparison), an imagerecognition program compares the reflective profiles on a pixel-by-pixelbasis. In some embodiments, a tolerance is set (to account for errors,image quality variations, differing environmental conditions, etc.) toautomate a validation process, and reflective marks that fall outside ofthe tolerance can be flagged for further comparison. In embodiments inwhich the reflective profiles are numerical values (e.g.,thermoreflectance coefficients, reflectance values, temperatures, etc.),an application performs a numerical comparison on the reflectiveprofiles. In embodiments in which the reflective profiles are text(e.g., data stored as a string), an application performs a stringcomparison on the reflective profiles. Additionally, values included incharts, arrays, vectors, etc. can be stored as strings (e.g., a chartcan be stored as a series of characters and delimiters, an array can bestored as an array data type including a series of charactersrepresenting values, and a vector can be stored as a two values (one fora direction and a second for a magnitude)). In such embodiments, anapplication likewise performs a string comparison on the reflectiveprofiles. If the first control reflective profile does not match thefirst test reflective profile, the flow continues at block 416. If thefirst control reflective profile does match the first test reflectiveprofile, the flow continues at decision diamond 412.

At decision diamond 412, the second control reflective profile iscompared with the second test reflective profile. If the second controlreflective profile does not match the second test reflective profile,the flow continues at block 416. If the second control reflectiveprofile does match the second test reflective profile, the flowcontinues at block 414.

At block 414, because both the first control reflective profile and thefirst test reflective profile match and the second control reflectiveprofile and the second test reflective profile match, a validationindication is recorded. From block 414, the flow ends.

At block 416, it has previously been determined that either the firstcontrol reflective profile and the first test reflective profile, or thesecond control reflective profile and the second test reflectiveprofile, do not match. Because of the inconsistency between the controlreflective profiles and the test reflective profiles, an invalidationindication is recorded. From block 416, the flow ends.

Although examples refer to using a first temperature and a secondtemperature to create a control reflective profile for athermoreflective mark and using the same first temperature and secondtemperature to validate a test thermoreflective mark, in someembodiments, a variation in temperatures is held constant instead. Insuch embodiments, the test thermoreflective mark is validated using acalculated thermoreflectance coefficient. For example, the equationC=(1/R)(ΔR/ΔT) can be used to calculate the thermoreflectancecoefficient, where C is the thermoreflectance coefficient, R is thereflectance, and T is the temperature. As can be seen, thethermoreflectance coefficient is directly proportional to the relativemagnitude change in reflectance (i.e., the difference between thereflectance at the first temperature and the reflectance at the secondtemperature, divided by the reflectance at the first temperature), andinversely proportional to the change in the temperature (i.e., thedifference between the first temperature and the second temperature).Consequently, so long as the reflectance of the thermoreflective mark(i.e., R) is recorded at the temperature at which the first controlreflective profile was created, and the difference between the firsttemperature and the second temperature used to make the first controlreflective profile and the second control reflective profile is known, atest thermoreflective mark can be validated by calculating thethermoreflectance coefficient for the test thermoreflective mark.Additionally, in some embodiments, the wavelength of the electromagneticwave can be varied from a control reflective profile to a testreflective profile. Again, in such embodiments, the derivedthermoreflectance constant is used to validate the test thermoreflectivemark. Furthermore, in embodiments in which a test thermoreflectivecoefficient is calculated, not all operations depicted in FIG. 4 arenecessary. For example, the operations depicted at blocks 410 and 412are not necessary. Rather, the calculated thermoreflectance coefficientof the test thermoreflective mark is compared to the thermoreflectancecoefficient of the thermoreflective mark that is genuine. However, anadditional operation can be performed to compare the specified patternof the thermoreflective mark that is genuine and a pattern of the testthermoreflective mark.

Although examples refer to using a first temperature and a secondtemperature, in some embodiments, more than two temperatures can be usedto create reflective profiles. For example, reflective profiles can becreated for a control thermoreflective mark at a first temperature, asecond temperature, a third temperature, etc. Such embodiments canprovide greater anti-counterfeiting protection.

As will be appreciated by one skilled in the art, aspects of the presentinventive subject matter may be embodied as a system, method or computerprogram product. Accordingly, aspects of the present inventive subjectmatter may take the form of an entirely hardware embodiment, an entirelysoftware embodiment (including firmware, resident software, micro-code,etc.) or an embodiment combining software and hardware aspects that mayall generally be referred to herein as a “circuit,” “module” or“system.” Furthermore, aspects of the present inventive subject mattermay take the form of a computer program product embodied in one or morecomputer readable medium(s) having computer readable program codeembodied thereon.

Any combination of one or more computer readable medium(s) may beutilized. The computer readable medium may be a computer readable signalmedium or a computer readable storage medium. A computer readablestorage medium may be, for example, but not limited to, an electronic,magnetic, optical, electromagnetic, infrared, or semiconductor system,apparatus, or device, or any suitable combination of the foregoing. Morespecific examples (a non-exhaustive list) of the computer readablestorage medium would include the following: an electrical connectionhaving one or more wires, a portable computer diskette, a hard disk, arandom access memory (RAM), a read-only memory (ROM), an erasableprogrammable read-only memory (EPROM or Flash memory), an optical fiber,a portable compact disc read-only memory (CD-ROM), an optical storagedevice, a magnetic storage device, or any suitable combination of theforegoing. In the context of this document, a computer readable storagemedium may be any tangible medium that can contain, or store a programfor use by or in connection with an instruction execution system,apparatus, or device.

A computer readable signal medium may include a propagated data signalwith computer readable program code embodied therein, for example, inbaseband or as part of a carrier wave. Such a propagated signal may takeany of a variety of forms, including, but not limited to,electro-magnetic, optical, or any suitable combination thereof. Acomputer readable signal medium may be any computer readable medium thatis not a computer readable storage medium and that can communicate,propagate, or transport a program for use by or in connection with aninstruction execution system, apparatus, or device.

Program code embodied on a computer readable medium may be transmittedusing any appropriate medium, including but not limited to wireless,wireline, optical fiber cable, RF, etc., or any suitable combination ofthe foregoing.

Computer program code for carrying out operations for aspects of thepresent inventive subject matter may be written in any combination ofone or more programming languages, including an object orientedprogramming language such as Java, Smalltalk, C++ or the like andconventional procedural programming languages, such as the “C”programming language or similar programming languages. The program codemay execute entirely on the user's computer, partly on the user'scomputer, as a stand-alone software package, partly on the user'scomputer and partly on a remote computer or entirely on the remotecomputer or server. In the latter scenario, the remote computer may beconnected to the user's computer through any type of network, includinga local area network (LAN) or a wide area network (WAN), or theconnection may be made to an external computer (for example, through theInternet using an Internet Service Provider).

Aspects of the present inventive subject matter are described withreference to flowchart illustrations and/or block diagrams of methods,apparatus (systems) and computer program products according toembodiments of the inventive subject matter. It will be understood thateach block of the flowchart illustrations and/or block diagrams, andcombinations of blocks in the flowchart illustrations and/or blockdiagrams, can be implemented by computer program instructions. Thesecomputer program instructions may be provided to a processor of ageneral purpose computer, special purpose computer, or otherprogrammable data processing apparatus to produce a machine, such thatthe instructions, which execute via the processor of the computer orother programmable data processing apparatus, create means forimplementing the functions/acts specified in the flowchart and/or blockdiagram block or blocks.

These computer program instructions may also be stored in a computerreadable medium that can direct a computer, other programmable dataprocessing apparatus, or other devices to function in a particularmanner, such that the instructions stored in the computer readablemedium produce an article of manufacture including instructions whichimplement the function/act specified in the flowchart and/or blockdiagram block or blocks.

The computer program instructions may also be loaded onto a computer,other programmable data processing apparatus, or other devices to causea series of operational steps to be performed on the computer, otherprogrammable apparatus or other devices to produce a computerimplemented process such that the instructions which execute on thecomputer or other programmable apparatus provide processes forimplementing the functions/acts specified in the flowchart and/or blockdiagram block or blocks.

FIG. 5 depicts an example computer system that includes athermoreflective anti-counterfeiting unit 514. A computer systemincludes a processor unit 502 (possibly including multiple processors,multiple cores, multiple nodes, and/or implementing multi-threading,etc.). The computer system includes memory 506. The memory 506 may besystem memory (e.g., one or more of cache, SRAM, DRAM, zero capacitorRAM, Twin Transistor RAM, eDRAM, EDO RAM, DDR RAM, EEPROM, NRAM, RRAM,SONOS, PRAM, etc.) or any one or more of the above already describedpossible realizations of machine-readable media. The computer systemalso includes a bus 504 (e.g., PCI, ISA, PCI-Express, HyperTransport®,InfiniBand®, NuBus, etc.), a network interface 510 (e.g., an ATMinterface, an Ethernet interface, a Frame Relay interface, SONETinterface, wireless interface, etc.), and a storage device(s) 512 (e.g.,optical storage, magnetic storage, etc.). The system 500 includes athermoreflective anti-counterfeiting unit 514. The thermoreflectiveanti-counterfeiting unit 514 is operable to compare reflective profiles,calculate thermoreflectance constants, and compare thermoreflectanceconstants, as described herein. Any one of these functionalities may bepartially (or entirely) implemented in hardware and/or on the processingunit 502. For example, the functionality may be implemented with anapplication specific integrated circuit, in logic implemented in theprocessing unit 502, in a co-processor on a peripheral device or card,etc. In addition, these functionalities can be implemented with programinstructions encoded in the main memory 506, the storage device(s) 512,or other machine-readable media of the system 500. Further, realizationsmay include fewer or additional components not illustrated in FIG. 5(e.g., video cards, audio cards, additional network interfaces,peripheral devices, etc.). The processor unit 502, the storage device(s)512, and the network interface 510 are coupled to the bus 504. Althoughillustrated as being coupled to the bus 504, the memory 506 may becoupled to the processor unit 502. Additionally, the computer system 500can include an electromagnetic wave source 508 and an electromagneticwave detector 516. The electromagnetic wave source 508 is operable topresent an electromagnetic wave to a thermoreflective mark. Theelectromagnetic wave detector 516 is operable to detect theelectromagnetic wave, as reflected by the thermoreflective mark.Computer system 500 may also include a temperature control 518.Temperature control element 518 may be used to heat a thermoreflectivemark to different temperatures.

While the embodiments are described with reference to variousimplementations and exploitations, it will be understood that theseembodiments are illustrative and that the scope of the inventive subjectmatter is not limited to them. In general, techniques forthermoreflective anti-counterfeiting as described herein may beimplemented with facilities consistent with any hardware system orhardware systems. Many variations, modifications, additions, andimprovements are possible.

Plural instances may be provided for components, operations orstructures described herein as a single instance. Finally, boundariesbetween various components, operations and data stores are somewhatarbitrary, and particular operations are illustrated in the context ofspecific illustrative configurations. Other allocations of functionalityare envisioned and may fall within the scope of the inventive subjectmatter. In general, structures and functionality presented as separatecomponents in the exemplary configurations may be implemented as acombined structure or component. Similarly, structures and functionalitypresented as a single component may be implemented as separatecomponents. These and other variations, modifications, additions, andimprovements may fall within the scope of the inventive subject matter.

What is claimed is:
 1. A computer program product for validating a test thermoreflective mark, the computer program product comprising: a non-transitory computer readable storage medium having computer usable program code embodied therewith, the computer usable program code configured to: control a temperature regulation unit configured to govern a temperature of a thermoreflective mark; control an electromagnetic wave emitter to present, to the thermoreflective mark at a first temperature, a first electromagnetic wave, wherein the thermoreflective mark has a pattern and a temperature sensitive coating; record a first reflective profile detected by an electromagnetic wave detector and produced from said presentation of the first electromagnetic wave to the thermoreflective mark at the first temperature; control the electromagnetic wave emitter to present, to the thermoreflective mark at a second temperature, a second electromagnetic wave; record a second reflective profile detected by an electromagnetic wave detector and produced from said presentation of the second electromagnetic wave to the thermoreflective mark at the second temperature; and validate the thermoreflective mark based, at least in part, on the first reflective profile and the second reflective profile, wherein said validating of the thermoreflective mark is against control data that are based on a control thermoreflective mark.
 2. The computer program product of claim 1, wherein the control data are a first control reflective profile produced from the control thermoreflective mark and a second control reflective profile produced from the control thermoreflective mark, and the computer usable program code further comprising code to: determine that the first reflective profile and the first control reflective profile match; and determine that the second reflective profile and the second control reflective profile match.
 3. The computer program product of claim 1, wherein the control data comprise one or more of a reflectance of the control thermoreflective mark, a thermoreflectance coefficient for the control thermoreflective mark, and a temperature, and the computer usable program code further comprising code to: calculate, based, at least in part, on the first reflective profile and the second reflective profile, a thermoreflectance coefficient for the thermoreflective mark; and compare the thermoreflectance coefficient for the thermoreflective mark and the thermoreflectance coefficient of the control thermoreflective mark.
 4. The computer program product of claim 1, wherein the temperature sensitive coating comprises a metallic thin film.
 5. The computer program product of claim 1, wherein the pattern comprises one or more of etchings, engravings, metallic dots, and metallic buildups.
 6. The computer program product of claim 1, wherein the first reflective profile and the second reflective profile include one or more of images, charts, graphs, thermoreflectance coefficients, temperatures, incidence angles, wavelengths, arrays, vectors, and positions on the thermoreflective mark from which the first and second electromagnetic wave was reflected.
 7. An apparatus comprising: a processor; an electromagnetic wave emitter configured to present electromagnetic waves to a thermoreflective mark; an electromagnetic wave detector configured to detect electromagnetic waves reflected by the thermoreflective mark; a temperature control element; and a non-transitory computer readable storage medium having computer usable program code embodied therewith, the computer usable program code comprising a computer useable program code configured to: direct the temperature control element to heat the thermoreflective mark to at least two different temperatures; cause the electromagnetic wave emitter to present, to the thermoreflective mark at a first temperature, a first electromagnetic wave, wherein the thermoreflective mark has a pattern and a temperature sensitive coating; generate a first reflective profile based on the first electromagnetic wave reflected off the thermoreflective mark at a first temperature as detected by the electromagnetic wave detector at the first temperature; cause the electromagnetic wave emitter to present, to the thermoreflective mark at a second temperature, a second electromagnetic wave; generate a second reflective profile based on the second electromagnetic wave reflected off the thermoreflective mark at the second temperature as detected by the electromagnetic wave detector; and validate the thermoreflective mark based, at least in part, on the first reflective profile and the second reflective profile, wherein said validating the thermoreflective mark is against control data that are based on a control thermoreflective mark.
 8. The apparatus of claim 7, wherein the control data are a first control reflective profile produced from the control thermoreflective mark and a second control reflective profile produced from the control thermoreflective mark, and wherein the computer usable program code is further configured to: determine that the first reflective profile and the first control reflective profile match; and determine that the second reflective profile and the second control reflective profile match.
 9. The apparatus of claim 7, wherein the control data comprise one or more of a reflectance of the control thermoreflective mark, a thermoreflectance coefficient for the control thermoreflective mark, and a temperature, and wherein the computer usable program code is further configured to: calculate, based, at least in part, on the first reflective profile and the second reflective profile, a thermoreflectance coefficient for the thermoreflective mark; and compare the thermoreflectance coefficient for the thermoreflective mark and the thermoreflectance coefficient of the control thermoreflective mark.
 10. The apparatus of claim 7, wherein the temperature sensitive coating comprises a metallic thin film.
 11. The apparatus of claim 7, wherein the pattern comprises one or more of etchings, engravings, metallic dots, and metallic buildups.
 12. The apparatus of claim 7, wherein the first reflective profile and the second reflective profile include one or more of images, charts, graphs, thermoreflectance coefficients, temperatures, incidence angles, wavelengths, arrays, vectors, and positions on the thermoreflective mark from which the first and second electromagnetic wave was reflected.
 13. The apparatus of claim 8, wherein the computer usable program code is further configured to: aggregate the first control reflective profile and the second control reflective profile; and create, based at least in part on the aggregation, a control identifying fingerprint for the control thermoreflective mark. 